Spektroskopija na nanoskali s polariziranimi X‐žarki s tehniko NEXAFS‐TXM
author: Polona Umek,
Odsek za fiziko trdne snovi, Institut "Jožef Stefan"
published: Jan. 17, 2014, recorded: October 2013, views: 1556
published: Jan. 17, 2014, recorded: October 2013, views: 1556
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