MIT 2.830J / 6.780J / ESD.63J Control of Manufacturing Processes (SMA 6303)
recorded by: Massachusetts Institute of Technology, MIT
released under terms of: Creative Commons Attribution Non-Commercial Share Alike (CC-BY-NC-SA)
released under terms of: Creative Commons Attribution Non-Commercial Share Alike (CC-BY-NC-SA)
This course explores statistical modeling and control in manufacturing processes. Topics include the use of experimental design and response surface modeling to understand manufacturing process physics, as well as defect and parametric yield modeling and optimization. Various forms of process control, including statistical process control, run by run and adaptive control, and real-time feedback control, are covered. Application contexts include semiconductor manufacturing, conventional metal and polymer processing, and emerging micro-nano manufacturing processes.
Course Homepage: 2.830J / 6.780J / ESD.63J Control of Manufacturing Processes (SMA 6303)
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